ELEG 53603 — Semiconductor Material and Device Characterization
This course provides an overview of semiconductor characterization techniques in industry: Electrical measurements, Optical measurements, Electron and ion beam measurements, X-ray and probe measurements. Prerequisite: ELEG 42003 or ELEG 52003 and instructor consent. (Typically offered: Irregular)
Prerequisites: ELEG 42003, ELEG 52003